| Established in 1952 | |
Page: 3330 |
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Standard Extensions raise and
extend C. M. M. Probe Characterizing and C. N. C.
Target Spheres. They are also used to securely couple
measuring devices to the C. M. M. or C. N. C.
table.
See: Technical Data Sheet CMM-12 |
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Copyright © 1999-2006
Micro Surface Engr. Inc. |
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